Equipment: Atomic Force Microscopes (AFM)

• Atomic Force Microscope (AFM) for morphological and functional characterization of surfaces at the nanoscale.

ATTENTION:

To request services with this equipment,
know the terms and conditions,
please get in touch with
Marcos Henrique de Pinho Mauricio.

Other equipment:

• Automated Optical Microscopes
• Particle Analyzer
• X-ray Microtomography